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Title: Liquid film thickness measurement by two-line TDLAS

A fiber-based two-line tunable diode-laser absorption sensor with two near-infrared (NIR) distributed-feedback (DFB) diode lasers at ∼1.4 μm was used for non-intrusive time-resolved liquid water film thickness measurement. When probing the liquid film at two different wavelengths with significantly different absorption cross-sections, the additional signal losses due to surface fowling, reflection and beam steering can be eliminated. In this work, the evaporation process of a liquid film on transparent quartz plate was tracked and large fluctuations of film thickness were found at the end of the evaporation.
Authors:
 [1] ; ;  [2] ; ; ;  [3]
  1. School of Energy and Power Engineering, University of Shanghai for Science and Technology, 200093, Shanghai, China and IVG, University of Duisburg-Essen, 47057, Duisburg (Germany)
  2. School of Energy and Power Engineering, University of Shanghai for Science and Technology, 200093, Shanghai (China)
  3. IVG, University of Duisburg-Essen, 47057, Duisburg (Germany)
Publication Date:
OSTI Identifier:
22271099
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1592; Journal Issue: 1; Conference: 8. international symposium on measurement techniques for multiphase flows, Guangzhou (China), 13-15 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION; DIODE-PUMPED SOLID STATE LASERS; EVAPORATION; FEEDBACK; FIBERS; FILMS; FLUCTUATIONS; LIQUIDS; QUARTZ; SENSORS; SIGNALS; THICKNESS; TIME RESOLUTION