Liquid film thickness measurement by two-line TDLAS

Journal Article · Fri Apr 11 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4872109· OSTI ID:22271099

Yang, Huinan ^[1]; Chen, Jun; Cai, Xiaoshu ^[2]; Greszik, Daniel; Dreier, Thomas; Schulz, Christof ^[3]

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1. School of Energy and Power Engineering, University of Shanghai for Science and Technology, 200093, Shanghai, China and IVG, University of Duisburg-Essen, 47057, Duisburg (Germany)
2. School of Energy and Power Engineering, University of Shanghai for Science and Technology, 200093, Shanghai (China)
3. IVG, University of Duisburg-Essen, 47057, Duisburg (Germany)

A fiber-based two-line tunable diode-laser absorption sensor with two near-infrared (NIR) distributed-feedback (DFB) diode lasers at ∼1.4 μm was used for non-intrusive time-resolved liquid water film thickness measurement. When probing the liquid film at two different wavelengths with significantly different absorption cross-sections, the additional signal losses due to surface fowling, reflection and beam steering can be eliminated. In this work, the evaporation process of a liquid film on transparent quartz plate was tracked and large fluctuations of film thickness were found at the end of the evaporation.

• OSTI ID: 22271099
• Journal Information: AIP Conference Proceedings, Vol. 1592, Issue 1; Conference: 8. international symposium on measurement techniques for multiphase flows, Guangzhou (China), 13-15 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION
DIODE-PUMPED SOLID STATE LASERS
EVAPORATION
FEEDBACK
FIBERS
FILMS
FLUCTUATIONS
LIQUIDS
QUARTZ
SENSORS
SIGNALS
THICKNESS
TIME RESOLUTION