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Title: Growth of vertically aligned α−MoO{sub 3} nanoflakes by using a facile PVD route

In this report, we synthesize vertically aligned molybdenum trioxide (α−MoO{sub 3}) nanoflakes (NFs) with high aspect ratio (height/thickness >15) on the cobalt coated glass substrates by the plasma assisted sublimation process, employing Mo metal strip as a sublimation source. The effect of substrate temperature, nature of substrate as well as the geometry of the sublimation source (Mo-strip) have been investigated on the morphological, structural and optical properties of the grown NFs, keeping plasma parameters as fixed. The surface morphology, crystalline structure and optical properties of MoO{sub 3} NFs have been studied systematically by using scanning electron microscope (SEM), transmission electron microscope (TEM) with selected area electron diffraction (SAED), X-ray diffractometer, and IR- spectroscopy. The experimental observations endorse that the characteristics of MoO{sub 3} NFs are strongly depend on substrate temperature, substrate nature as well as geometry of Mo-strip. All the observed results are well in consonance with each other.
Authors:
;  [1]
  1. Thin Film Laboratory, Physics Department, Indian Institute of Technology Delhi, New Delhi-110016 (India)
Publication Date:
OSTI Identifier:
22271052
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; COBALT; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; GLASS; INFRARED SPECTRA; MOLYBDENUM OXIDES; MORPHOLOGY; NANOSTRUCTURES; OPTICAL PROPERTIES; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBLIMATION; SUBSTRATES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION