Preparation of Cu-doped nickel oxide thin films and their properties

Journal Article · Thu Apr 24 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4872790· OSTI ID:22271049

Gowthami, V.; Meenakshi, M.; Anandhan, N. ^[1]

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1. School of Physics, Alagappa University, Karaikudi-630004 (India)

Copper doped Nickel oxide film was preferred on glass substrate by simple nebulizer technique keeping the substrate temperature at 350°C and characterized by X-ray diffraction (XRD), Photoluminescence (PL) and Four probe resistivity measurements. XRD studies indicated cubic structure and the crystallites are preferentially oriented along the [111] direction. Interesting results have been obtained from the study of PL spectra. A peak corresponding to 376nm in the emission spectra for 0%, 5% and 10% copper doped samples. The samples show sharp and strong UV emission corresponding to the near band edge emission under excitation of 275nm.

• OSTI ID: 22271049
• Journal Information: AIP Conference Proceedings, Vol. 1591, Issue 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CONCENTRATION RATIO
COPPER COMPOUNDS
CUBIC LATTICES
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
EMISSION SPECTRA
EXCITATION
GLASS
NICKEL OXIDES
PHOTOLUMINESCENCE
SUBSTRATES
THIN FILMS
ULTRAVIOLET RADIATION
X-RAY DIFFRACTION