skip to main content

Title: Characterization of montmorillonite doped PVA/SA blends using X-ray diffraction

PVA films doped with Montmorillonite was prepared by slow evaporation technique. These films have been used to record X-ray patterns at room temperature. Correlation lengths and microstructural parameters were computed using in-house program employing X-ray data. Results show that correlation lengths as well as crystallite size increases with increase in the concentration of Montmorillonite which is inconformity with the conductivity studies.
Authors:
;  [1] ; ;  [2]
  1. Department of Physics, Yuvaraja's College, University of Mysore, Manasagangotri, Mysore-570005 (India)
  2. Department of Studies in Physics, University of Mysore, Manasagangotri, Mysore-570006 (India)
Publication Date:
OSTI Identifier:
22271035
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CONCENTRATION RATIO; CORRELATIONS; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; EVAPORATION; FILMS; MICROSTRUCTURE; MONTMORILLONITE; PVA; TEMPERATURE RANGE 0273-0400 K; X-RAY DIFFRACTION