Characterization of montmorillonite doped PVA/SA blends using X-ray diffraction

Journal Article · Thu Apr 24 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4872767· OSTI ID:22271035

Hemalatha, K.; Somashekarappa, H. ^[1]; Mahadevaiah,

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1. Department of Physics, Yuvaraja's College, University of Mysore, Manasagangotri, Mysore-570005 (India)

PVA films doped with Montmorillonite was prepared by slow evaporation technique. These films have been used to record X-ray patterns at room temperature. Correlation lengths and microstructural parameters were computed using in-house program employing X-ray data. Results show that correlation lengths as well as crystallite size increases with increase in the concentration of Montmorillonite which is inconformity with the conductivity studies.

• OSTI ID: 22271035
• Journal Information: AIP Conference Proceedings, Vol. 1591, Issue 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CONCENTRATION RATIO
CORRELATIONS
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
EVAPORATION
FILMS
MICROSTRUCTURE
MONTMORILLONITE
PVA
TEMPERATURE RANGE 0273-0400 K
X-RAY DIFFRACTION