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Title: REIONIZATION ON LARGE SCALES. II. DETECTING PATCHY REIONIZATION THROUGH CROSS-CORRELATION OF THE COSMIC MICROWAVE BACKGROUND

Journal Article · · Astrophysical Journal
; ;  [1];  [2];  [3]
  1. McWilliams Center for Cosmology, Department of Physics, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213 (United States)
  2. Canadian Institute for Theoretical Astrophysics, University of Toronto, 60 St. George Street, Toronto, ON M5S 3H8 (Canada)
  3. Institute for Theory and Computation, Harvard University, 60 Garden Street, Cambridge, MA 02138 (United States)

We investigate the effect of patchy reionization on the cosmic microwave background (CMB) temperature. An anisotropic optical depth τ( n-hat ) alters the TT power spectrum on small scales l > 2000. We make use of the correlation between the matter density and the reionization redshift fields to construct full sky maps of τ( n-hat ). Patchy reionization transfers CMB power from large scales to small scales, resulting in a non-zero cross correlation between large and small angular scales. We show that the patchy τ correlator is sensitive to small root mean square (rms) values τ{sub rms} ∼ 0.003 seen in our maps. We include frequency-independent secondaries such as CMB lensing and kinetic Sunyaev-Zel'dovich (kSZ) terms, and show that patchy τ may still be detected at high significance. Reionization models that predict different values of τ{sub rms} may be distinguished even for the same mean value (τ). It is more difficult to detect patchy τ in the presence of larger secondaries such as the thermal Sunyaev-Zel'dovich, radio background, and the cosmic infrared background. In this case, we show that patchy τ may be detected if these frequency-dependent secondaries are minimized to ∼< 5 μK (rms) by means of a multi-frequency analysis. We show that the patchy τ correlator provides information that is complementary to what may be obtained from the polarization and the kSZ power spectra.

OSTI ID:
22270766
Journal Information:
Astrophysical Journal, Vol. 776, Issue 2; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 0004-637X
Country of Publication:
United States
Language:
English