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Title: Direct imaging of LaAlO{sub 3}/SrTiO{sub 3} nanostructures using piezoresponse force microscopy

The interface between LaAlO{sub 3} and TiO{sub 2}-terminated SrTiO{sub 3} can be switched between metastable conductive and insulating states using a conductive atomic force microscope probe. Determination of the nanoscale dimensions has previously required a destructive readout (e.g., local restoration of an insulating state). Here it is shown that high-resolution non-destructive imaging of conductive nanostructures can be achieved using a specific piezoresponse force microscopy (PFM) technique. Images of conductive and insulating nanoscale features are achieved with feature sizes as small as 30 nm. The measured nanowire width from PFM is well correlated with those obtained from nanowire erasure.
Authors:
; ; ;  [1] ; ;  [2]
  1. Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, Pennsylvania 15260 (United States)
  2. Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)
Publication Date:
OSTI Identifier:
22269585
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 1; Journal Issue: 5; Other Information: (c) 2013 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; ALUMINATES; ATOMIC FORCE MICROSCOPY; LANTHANUM COMPOUNDS; NANOSTRUCTURES; STRONTIUM TITANATES; TITANIUM OXIDES