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Title: Tuning cationic composition of La:EuTiO{sub 3−δ} films

Eu{sub 1−x}La{sub x}TiO{sub 3−δ} (x = 0, 0.3, 0.5) films were deposited in a p(Ar(96%)/H{sub 2}(4%)) = 4 × 10{sup −4} mbar atmosphere on (LaAlO{sub 3}){sub 0.3}-(Sr{sub 2}AlTaO{sub 6}){sub 0.7} vicinal substrates (0.1°). Reflection high-energy electron diffraction oscillation characteristics of a layer-by-layer growth mode were observed for stoichiometric and Ti-rich films and the laser fluence suited to deposit stoichiometric films was identified to be 1.25 J/cm{sup 2} independent of the La content. The variety of resulting film compositions follows the general trend of Eu-enrichment for low laser and Ti-enrichment for high laser fluence. X-ray diffraction confirms that all the films are compressively strained with a general trend of an increase of c-axis elongation for non-stoichiometric films. The surfaces of non-stoichiometric films have an increased roughness, the highest sheet resistances, exhibit the presence of islands, and are Eu{sup 3+} rich for films deposited at low laser fluence.
Authors:
 [1] ;  [2] ; ; ; ; ;  [1] ;  [3]
  1. Forschungszentrum Jülich, Peter Grünberg Institut (PGI-7), D-52425 Jülich (Germany)
  2. (Switzerland)
  3. Empa, Solid State Chemistry and Catalysis, CH-8600 Dübendorf (Switzerland)
Publication Date:
OSTI Identifier:
22269583
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 1; Journal Issue: 5; Other Information: (c) 2013 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINATES; DEPOSITS; ELECTRON DIFFRACTION; EUROPIUM IONS; FILMS; LANTHANUM COMPOUNDS; OSCILLATIONS; SUBSTRATES; X-RAY DIFFRACTION