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Title: Cerium reduction at the interface between ceria and yttria-stabilised zirconia and implications for interfacial oxygen non-stoichiometry

Epitaxial CeO{sub 2} films with different thickness were grown on Y{sub 2}O{sub 3} stabilised Zirconia substrates. Reduction of cerium ions at the interface between CeO{sub 2} films and yttria stabilised zirconia substrates is demonstrated using aberration-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy. It is revealed that most of the Ce ions were reduced from Ce{sup 4+} to Ce{sup 3+} at the interface region with a decay of several nanometers. Several possibilities of charge compensations are discussed. Irrespective of the details, such local non-stoichiometries are crucial not only for understanding charge transport in such hetero-structures but also for understanding ceria catalytic properties.
Authors:
 [1] ;  [2] ;  [3] ; ;  [1] ; ; ;  [4] ;  [5]
  1. Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Heisenbergstraße 3, 70569 Stuttgart (Germany)
  2. (China)
  3. INM-Leibniz Institute for New Materials, Campus D2 2, D-66123 Saarbrücken (Germany)
  4. Max Planck Institute for Solid State Research, Heisenbergstraße 1, 70569 Stuttgart (Germany)
  5. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang (China)
Publication Date:
OSTI Identifier:
22269550
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 2; Journal Issue: 3; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CERIUM; CERIUM IONS; CERIUM OXIDES; ENERGY-LOSS SPECTROSCOPY; EPITAXY; FILMS; INTERFACES; OXYGEN; REDUCTION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM OXIDES; ZIRCONIUM OXIDES