Synchrotron total reflection X-ray fluorescence at BL-16 microfocus beamline of Indus-2

Journal Article · Thu Apr 24 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4872703· OSTI ID:22269532

Das, Gangadhar; Chowdhury, Anupam

Determination of ultra trace elements is important in many disciplines both in basic and applied sciences. Numerous applications show their importance in medical science, environmental science, materials science, food processing and semiconductor industries and in maintaining the quality control of ultra pure chemicals and reagents. We report commissioning of a synchrotron based total reflection x-ray fluorescence (TXRF) facility on the BL-16 microfocus beamline of Indus-2. This paper describes the performance of the BL-16 TXRF spectrometer and the detailed description of its capabilities through examples of measured results.

• OSTI ID: 22269532
• Journal Information: AIP Conference Proceedings, Vol. 1591, Issue 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
INDUS-2
MULTI-ELEMENT ANALYSIS
PERFORMANCE
QUANTITATIVE CHEMICAL ANALYSIS
REFLECTION
SYNCHROTRON RADIATION
TRACE AMOUNTS
X-RAY FLUORESCENCE ANALYSIS
X-RAY FLUORESCENCE ANALYZERS
X-RAY SPECTROMETERS