Soft X-ray absorption spectroscopy of La{sub 0.7}Ca{sub 0.3}Mn{sub 1−X}Al{sub X}O{sub 3} thin films

Journal Article · Thu Apr 24 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4872695· OSTI ID:22269525

Kumar, Manish

Epitaxial thin films of rare earth manganites have generated much attention recently due to their rich phase diagram. The electronic structure of these films is playing a very crucial role and demands a fundamental understanding prior to device fabrication. We have investigated the electronic structure of La{sub 0.7}Ca{sub 0.3}Mn{sub 1−X}Al{sub X}O{sub 3} (X=0, 0.15) epitaxial thin films by soft X-ray absorption spectroscopy technique using the surface sensitive total electron yield (TEY) mode.

• OSTI ID: 22269525
• Journal Information: AIP Conference Proceedings, Vol. 1591, Issue 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTROSCOPY
CALCIUM COMPOUNDS
CONCENTRATION RATIO
ELECTRONIC STRUCTURE
EPITAXY
LANTHANUM COMPOUNDS
MANGANATES
PHASE DIAGRAMS
SOFT X RADIATION
THIN FILMS
X-RAY SPECTROSCOPY