FTIR and XRD study of PMMA/PCTFE blend films

Journal Article · Thu Apr 24 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4872541· OSTI ID:22269420

Shripathi, T. ^[1]; Tripathi, J. ^[2]; Agrawal, A. ^[3]; Sharma, A. ^[4]

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1. UGC-DAE Consortium for Scientific Research, Khandwa Road, Indore-452001 (India)
2. Dept. of Physics, ISLE, IPS Academy, Indore-452008 (India)
3. Dept. of Electronics and Communications, Global Engineering College, Jabalpur-482001 (India)
4. Department of Physics, Manipal University, Jaipur-302026 (India)

The results are reported on solution cast PMMA-PCTFE blend films characterized using x-ray diffraction and FTIR. The nanocrystalline nature of PMMA is still seen in the blends, however, the bond modifications are clearly observed. The addition of PCTFE results in the modification in structural properties, as reflected in the XRD and FTIR spectra showing modifications in bonding as a function of PCTFE percentage.

• OSTI ID: 22269420
• Journal Information: AIP Conference Proceedings, Vol. 1591, Issue 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
CRYSTALS
FILMS
FOURIER TRANSFORMATION
INFRARED SPECTRA
NANOSTRUCTURES
PMMA
X-RAY DIFFRACTION