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Title: FTIR and XRD study of PMMA/PCTFE blend films

The results are reported on solution cast PMMA-PCTFE blend films characterized using x-ray diffraction and FTIR. The nanocrystalline nature of PMMA is still seen in the blends, however, the bond modifications are clearly observed. The addition of PCTFE results in the modification in structural properties, as reflected in the XRD and FTIR spectra showing modifications in bonding as a function of PCTFE percentage.
Authors:
;  [1] ;  [2] ;  [3] ;  [4]
  1. UGC-DAE Consortium for Scientific Research, Khandwa Road, Indore-452001 (India)
  2. Dept. of Physics, ISLE, IPS Academy, Indore-452008 (India)
  3. Dept. of Electronics and Communications, Global Engineering College, Jabalpur-482001 (India)
  4. Department of Physics, Manipal University, Jaipur-302026 (India)
Publication Date:
OSTI Identifier:
22269420
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; CRYSTALS; FILMS; FOURIER TRANSFORMATION; INFRARED SPECTRA; NANOSTRUCTURES; PMMA; X-RAY DIFFRACTION