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Title: Rietveld refinement and dielectric studies of Bi{sub 0.8}Ba{sub 0.2}Fe{sub 0.95}V{sub 0.05}O{sub 3} ceramic

Polycrystalline Bi{sub 0.8}Ba{sub 0.2}Fe{sub 0.95}V{sub 0.05}O{sub 3} ceramic has been prepared by the conventional solid state reaction technique. The Rietveld refinement of x-ray powder diffraction revealed that the sample has a rhombohedral crystal structure (space group R3c) with average particle size of 29 nm. The values of dielectric constant (ε′) and dielectric loss (tan δ) increases with increasing temperature at different frequencies which may be the result of increase in the number of charge carriers and their mobilities due to the thermal activation. The Jonscher’s universal power law used to analyze the ac conductivity. In the measured temperature range, the values of frequency exponent ‘s’ are less than one and shows a continous decrease which is attributed to the short range translational hopping assisted by large polaron hopping mechanisms.
Authors:
; ; ; ;  [1]
  1. Department of Applied Physics, Guru Jambheshwar University of Science and Technology, Hisar-125001, Haryana (India)
Publication Date:
OSTI Identifier:
22269392
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; CERAMICS; CHARGE CARRIERS; DIELECTRIC MATERIALS; PARTICLE SIZE; PERMITTIVITY; POLYCRYSTALS; SOLIDS; SPACE GROUPS; TEMPERATURE RANGE; TRIGONAL LATTICES; X-RAY DIFFRACTION