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Title: Dual anisotropic character in Fe/Pt multilayer grown on (001) MgO substrate

The multilayers of [Fe(5Å)/Pt(25 Å)]{sub ×15} were prepared by dc magnetron sputtering on 50 Å Pt-buffered MgO substrates. The structural characterization of the multilayers was carried out using X-ray diffraction, X-ray reflectivity. The Secondary ion mass spectroscopy measurement reveals the depth profile and compositional modulations of the multilayer films as per our design specifications. Room temperature magnetic measurements were carried out by using SQUID both in-plane and out-of-plane sample geometry. Magnetization measurements show similar M-H loops for both in-plane and out-of-plane directions of external magnetic field with a coercivity of 190 Oe. These measurements indicate that our samples are magnetically soft and have multifunctional character which is important for making magnetic tunnel junctions.
Authors:
 [1] ; ; ; ;  [2] ;  [3]
  1. Condensed Matter-Low Dimensional Systems Laboratory, Department of Physics, Indian Institute of Technology, Kanpur-208016 (India)
  2. National Physical Laboratory, Council of Scientific and Industrial Research, New Delhi-110012 (India)
  3. Condensed Matter-Low Dimensional Systems Laboratory, Department of Physics, Indian Institute of Technology, Kanpur-208016, India and National Physical Laboratory, Council of Scientific and Industrial Research, New Delhi-110012 (India)
Publication Date:
OSTI Identifier:
22269379
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COERCIVE FORCE; ION MICROPROBE ANALYSIS; LAYERS; MAGNESIUM OXIDES; MAGNETIC FIELDS; MAGNETIZATION; MAGNETRONS; MASS SPECTROSCOPY; REFLECTIVITY; SPUTTERING; SQUID DEVICES; SUBSTRATES; SUPERCONDUCTING JUNCTIONS; TUNNEL EFFECT; X RADIATION; X-RAY DIFFRACTION