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Title: Synthesis of Bi{sub 2}S{sub 3} with different sulfur content by conventional high temperature solid state solvothermal route

Bismuth sulfide (Bi{sub 2}S{sub 3}) is a binary chalcogenide compound material belonging to V-VI group of semiconductors. Because of its direct band gap of 1.3 eV and high figure of merit (ZT) value, it is widely used as a thermo electronic-cooling material based on the Peltier effect. The electrical and optical property of Bi{sub 2}S{sub 3} material is strongly dependent on stoichiometric composition, defect chemistry and structure. In this study, we have synthesized Bi{sub 2}S{sub x} (x = 3.15, 3.30, 3.45) compound material with different sulfur content by conventional high temperature solid state solvothermal reaction of bismuth and sulfur. X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive x-ray spectroscopy (EDXS) analysis of synthesized compound materials were carried out to observe crystallinity, surface morphology and composition of elements in the compound. The optical analysis revealed that energy band gap decreases with increase of sulfur content.
Authors:
;  [1] ;  [2]
  1. Department of Physics, Veer Narmad South Gujarat University, Surat-395007 (India)
  2. Physics Department, A.N. Shah Science College, Kamrej-394185 (India)
Publication Date:
OSTI Identifier:
22269337
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BISMUTH; BISMUTH SULFIDES; DEFECTS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SOLIDS; SULFUR; SULFUR CONTENT; SYNTHESIS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY