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Title: Optical properties of (Se{sub 80}Te{sub 20}){sub 100−x}Ag{sub x} (0 ≤ x ≤ 4) thin films

Thin films of (Se{sub 80}Te{sub 20}){sub 100−x}Ag{sub x} (0 ≤ x ≤ 4) glasses were prepared by thermal evaporation of the bulk samples. The transmittance (T) and reflection (R) spectra of amorphous thin films were obtained in the spectral region in the range 400–2500 nm. The optical band gap (E{sub g}) has been determined by Tauc’s extrapolation method. The surface morphology has been determined by the Scanning Electron Microscopy (SEM)
Authors:
; ; ;  [1]
  1. Semiconductors Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar-143005, Punjab (India)
Publication Date:
OSTI Identifier:
22269327
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; EXTRAPOLATION; GLASS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SPECTRA; SURFACES; THIN FILMS