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Title: Scaling behavior studies of Ar{sup +} ion irradiated ripple structured mica surfaces

We have studied scaling behavior of ripple structured mica surfaces. Clean mica (001) surface is sputtered by 500 eV Ar{sup +} ion beam at 40° incidence angle for different time ranging from 28 minutes to 245 minutes to form ripples on it. The scaling of roughness of sputtered surface characterized by AFM is observed into two regime here; one is super roughening which is for above the crossover bombardment time (i.e, t{sub x} ≥ 105 min) with the scaling exponents α = α{sub s} = 1.45 ± 0.03, α{sub local} = 0.87 ± 0.03, β = 1.81 ± 0.01, β{sub local} = 1.67 ± 0.07 and another is a new type of scaling dynamics for t{sub x} ≤ 105 min with the scaling exponents α = 0.95 (calculated), α{sub s} = 1.45 ± 0.03, α{sub local} = 0.87 ± 0.03, β = 1.81 ± 0.01, β{sub local} = 1.67 ± 0.07. In the super roughening scaling dynamics, two types of power law dependency is observed on spatial frequency of morphology (k): for higher k values PSD ∼ k{sup −4} describing diffusion controlled smoothening and for lower k values PSD ∼ k{sup −2} reflecting kinetic roughening.
Authors:
;  [1]
  1. Saha Institute of Nuclear Physics, Sector - 1, Block - AF, Bidhan Nagar, Kolkata - 700064 (India)
Publication Date:
OSTI Identifier:
22269215
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ARGON IONS; ATOMIC FORCE MICROSCOPY; DIFFUSION; INCIDENCE ANGLE; ION BEAMS; IRRADIATION; MICA; SCALING; SPUTTERING; SURFACES