skip to main content

SciTech ConnectSciTech Connect

Title: Structural and optical properties of Sn{sub 1−x}Fe{sub x}O{sub 2} thin films prepared by flash evaporation technique

Sn{sub 1−x}Fe{sub X}O{sub 2} (x = 0, 0.05) thin films were prepared on glass substrate using the flash evaporation technique. The samples were annealed at 773 K for 2 hrs in air atmosphere. A systematic study was carried out on the structural and optical properties of the as deposited and annealed thin films. From the X-ray diffraction analysis it was found that the Sn{sub 1−x}Fe{sub X}O{sub 2} films deposited at 623 K were amorphous in nature and the Sn{sub 1−x}Fe{sub X}O{sub 2} films annealed at 773 K exhibited the tetragonal structure of the SnO{sub 2}. The optical band gap of the SnO{sub 2} thin films was found to be as 3.17 eV whereas the optical band gap of the Sn{sub 1−x}Fe{sub X}O{sub 2} films was found to be as 3.01 eV after air annealing.
Authors:
; ; ; ;  [1]
  1. Thin Films Laboratory, School of Advanced Sciences, VIT University, Vellore-632014, Tamilnadu (India)
Publication Date:
OSTI Identifier:
22269214
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; ANNEALING; CHEMICAL PREPARATION; DEPOSITS; EVAPORATION; GLASS; OPTICAL PROPERTIES; SUBSTRATES; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION