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Title: Structural and optical properties of CdO thin films deposited by RF magnetron sputtering technique

Cadmium oxide (CdO) thin films were deposited on glass substrate by r.f. magnetron sputtering technique using a high purity (99.99%) Cd target of 2-inch diameter and 3 mm thickness in an Argon and oxygen mixed atmosphere with sputtering power of 50W and sputtering pressure of 2×10{sup −2} mbar. The prepared films were characterized by X-ray diffraction (XRD), optical spectroscopy and scanning electron microscopy (SEM). The XRD analysis reveals that the films were polycrystalline with cubic structure. The visible range transmittance was found to be over 70%. The optical band gap increased from 2.7 eV to2.84 eV with decrease of film thickness.
Authors:
;  [1] ;  [2]
  1. Department of Physics, Osmania University, Hyderabad-500007 (India)
  2. Department of Physics, Mahatma Gandhi University, Nalgonda-508003 (India)
Publication Date:
OSTI Identifier:
22269212
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CADMIUM OXIDES; DEPOSITS; MAGNETRONS; OPTICAL PROPERTIES; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; SPUTTERING; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION