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Title: Exfoliation of self-assembled 2D organic-inorganic perovskite semiconductors

Ultra-thin flakes of 2D organic-inorganic perovskite (C{sub 6}H{sub 9}C{sub 2}H{sub 4}NH{sub 3}){sub 2}PbI{sub 4} are produced using micromechanical exfoliation. Mono- and few-layer areas are identified using optical and atomic force microscopy, with an interlayer spacing of 1.6 nm. Refractive indices extracted from the optical spectra reveal a sample thickness dependence due to the charge transfer between organic and inorganic layers. These measurements demonstrate a clear difference in the exciton properties between “bulk” (>15 layers) and very thin (<8 layer) regions as a result of the structural rearrangement of organic molecules around the inorganic sheets.
Authors:
;  [1] ;  [2] ;  [3]
  1. NanoPhotonics Centre, Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE (United Kingdom)
  2. Cambridge Graphene Centre, Engineering Department, University of Cambridge, 9, JJ Thomson Avenue, Cambridge CB3 0FA (United Kingdom)
  3. Nanophotonics Lab, Department of Physics, Indian Institute of Technology Delhi, New Delhi 110016 (India)
Publication Date:
OSTI Identifier:
22267721
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 17; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; CARBON; HYDROGEN; LAYERS; LEAD; NITROGEN; PEROVSKITE; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS