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Title: Simulation of electron-matter interaction during wet-STEM electron tomography

Tomography is an efficient tool to probe the 3 dimensional (3D) structure of materials. In the laboratory, a device has been developed to perform electron tomography in an environmental scanning electron microscopy (ESEM). The configuration of Scanning Transmission Electron Microscopy (STEM) in Environmental Scanning Electron Microscopy (ESEM) provides a novel approach for the characterization of the 3D structure of materials and optimizes a compromise between the resolution level of a few nm and the large tomogram due to the high thickness of transparency. Moreover, STEM allows the observation in 2D of wet samples in an ESEM by finely controlling the sample temperature and the water pressure of the sample environment. It has been recently demonstrated that it was possible to acquire image series of hydrated objects and thus to attain 3D characterization of wet samples. In order to get reliable and quantitative data, the present study deals with the simulation of electron-matter interactions. From such simulation on the MCM-41 material, we determine the minimum quantity of water layer which can be detected on wet materials.
Authors:
 [1] ;  [2] ;  [3]
  1. MATEIS, INSA-Lyon, CNRS UMR5510, F-69621, France and Physics of Electronic Material, Departement of Physics, Faculty of Mathematic and Natural Sciences, ITB Jalan Ganesha No. 10, Bandung 40132 (Indonesia)
  2. MATEIS, INSA-Lyon, CNRS UMR5510, F-69621 (France)
  3. Physics of Electronic Material, Departement of Physics, Faculty of Mathematic and Natural Sciences, ITB Jalan Ganesha No. 10, Bandung 40132 (Indonesia)
Publication Date:
OSTI Identifier:
22266038
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1586; Journal Issue: 1; Conference: NNS2013: 5. nanoscience and nanotechnology symposium, Surabaya (Indonesia), 23-25 Oct 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; INTERACTIONS; SCANNING ELECTRON MICROSCOPY; SIMULATION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY