Effect of nano-sized Co{sub 3}O{sub 4} addition on the transport properties of YBa{sub 2}Cu{sub 3}O{sub 7−δ}
- Department of Physics, Universiti Putra Malaysia, 43400 Serdang, Selangor (Malaysia)
The effect of nano-sized Co{sub 3}O{sub 4} (10 - 30 nm) addition on YBa{sub 2}Cu{sub 3}O{sub 7−δ}(Co{sub 3}O{sub 4}){sub x} with x = 0 to 0.12 wt.% has been investigated by powder X-ray diffraction method, dc electrical resistance measurements and scanning electron microscopy. The Co{sub 3}O{sub 4} particle size was larger than the coherence length but smaller than the penetration depth of the YBa{sub 2}Cu{sub 3}O{sub 7−δ} superconductor. The onset transition temperature (T{sub c} {sub onset}) showed no significant changes for low Co{sub 3}O{sub 4} addition (x ≤ 0.02 wt. %) and then decreased monotonically with the increase in Co{sub 3}O{sub 4} content indicating a pair-breaking like mechanism in T{sub c} suppression for x = 0.03 to 0.12 wt. %. A sudden broadening of the superconducting-transition-width for x ≥ 0.11 wt. % was also observed. The transport properties were measured and related to the microstructure. Scanning electron micrographs showed homogeneous distribution of Co{sub 3}O{sub 4} throughout the samples and the distance between particles was smaller than 1 μm but larger than the typical Abrikosov vortex lattice constant.
- OSTI ID:
- 22264041
- Journal Information:
- AIP Conference Proceedings, Vol. 1574, Issue 1; Conference: International cryogenic materials conference, Anchorage, AK (United States), 17-21 Jun 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
COBALT OXIDES
COHERENCE LENGTH
ELECTRIC CONDUCTIVITY
ELECTRON SCANNING
LATTICE PARAMETERS
MICROSTRUCTURE
NANOSTRUCTURES
PARTICLE SIZE
PARTICLES
PENETRATION DEPTH
SCANNING ELECTRON MICROSCOPY
SUPERCONDUCTORS
TRANSITION TEMPERATURE
X-RAY DIFFRACTION