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Title: Structural and optical studies on AgSbSe{sub 2} thin films

AgSbSe{sub 2} semiconducting thin films are successfully deposited using reactive evaporation technique at a substrate temperature of 398K. X-ray diffraction studies reveal that the films are polycrystalline in nature. The structural parameters such as average particle size, dislocation density, and number of crystallites per unit have been evaluated. Atomic Force Microscopy is used to study the topographic characteristics of the film including the grain size and surface roughness. The silver antimony selenide thin films have high absorption coefficient of about 10{sup 5} cm{sup −1} and it has an indirect band gap of 0.64eV.
Authors:
; ;  [1]
  1. Solid State Physics Laboratory, Department of Physics, Cochin University of Science and Technology, Kochi- 22, Kerala (India)
Publication Date:
OSTI Identifier:
22264027
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1576; Journal Issue: 1; Conference: OMTAT 2013: 2. international conference on optoelectronic materials and thin films for advanced technology, Kochi, Kerala (India), 3-5 Jan 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; ABSORPTION; ATOMIC FORCE MICROSCOPY; DENSITY; DEPOSITS; DISLOCATIONS; GRAIN SIZE; PARTICLE SIZE; POLYCRYSTALS; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION