Structural and optical studies on AgSbSe{sub 2} thin films

Journal Article · Tue Jan 28 00:00:00 EST 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4861981· OSTI ID:22264027

Asokan, T. Namitha; Urmila, K. S.; Pradeep, B. ^[1]

---

1. Solid State Physics Laboratory, Department of Physics, Cochin University of Science and Technology, Kochi- 22, Kerala (India)

AgSbSe{sub 2} semiconducting thin films are successfully deposited using reactive evaporation technique at a substrate temperature of 398K. X-ray diffraction studies reveal that the films are polycrystalline in nature. The structural parameters such as average particle size, dislocation density, and number of crystallites per unit have been evaluated. Atomic Force Microscopy is used to study the topographic characteristics of the film including the grain size and surface roughness. The silver antimony selenide thin films have high absorption coefficient of about 10{sup 5} cm{sup −1} and it has an indirect band gap of 0.64eV.

• OSTI ID: 22264027
• Journal Information: AIP Conference Proceedings, Vol. 1576, Issue 1; Conference: OMTAT 2013: 2. international conference on optoelectronic materials and thin films for advanced technology, Kochi, Kerala (India), 3-5 Jan 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
ABSORPTION
ATOMIC FORCE MICROSCOPY
DENSITY
DEPOSITS
DISLOCATIONS
GRAIN SIZE
PARTICLE SIZE
POLYCRYSTALS
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION