Software optimization for electrical conductivity imaging in polycrystalline diamond cutters

Journal Article · Tue Feb 18 00:00:00 EST 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4865071· OSTI ID:22263789

Bogdanov, G.; Ludwig, R. ^[1]; Wiggins, J.; Bertagnolli, K. ^[2]

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1. Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, 100 Institute Rd, Worcester, MA 01609 (United States)
2. US Synthetic, 1260 South 1600 West, Orem, UT 84058 (United States)

We previously reported on an electrical conductivity imaging instrument developed for measurements on polycrystalline diamond cutters. These cylindrical cutters for oil and gas drilling feature a thick polycrystalline diamond layer on a tungsten carbide substrate. The instrument uses electrical impedance tomography to profile the conductivity in the diamond table. Conductivity images must be acquired quickly, on the order of 5 sec per cutter, to be useful in the manufacturing process. This paper reports on successful efforts to optimize the conductivity reconstruction routine, porting major portions of it to NVIDIA GPUs, including a custom CUDA kernel for Jacobian computation.

• OSTI ID: 22263789
• Journal Information: AIP Conference Proceedings, Vol. 1581, Issue 1; Conference: 40. annual review of progress in quantitative nondestructive evaluation, Baltimore, MD (United States), 21-26 Jul 2013, 10. international conference on Barkhausen noise and micromagnetic testing, Baltimore, MD (United States), 21-26 Jul 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CALCULATION METHODS
COMPUTER CODES
DIAMONDS
ELECTRIC CONDUCTIVITY
IMPEDANCE
KERNELS
OPTIMIZATION
POLYCRYSTALS
SUBSTRATES
TOMOGRAPHY
TUNGSTEN CARBIDES