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Title: Metrology, applications and methods with high energy CT systems

The increase of Computed Tomography (CT) as an applicable metrology and Non Destructive Testing (NDT) method raises interest on developing the application fields to larger objects, which were rarely used in the past due to their requirements on the imaging system. Especially the classical X-ray generation techniques based on standard equipment restricted the applications of CT to typical material penetration lengths of only a few cm of steel. Even with accelerator technology that offers a suitable way to overcome these restrictions just the 2D radioscopy technique found a widespread application. Beside the production and detection of photons in the MeV range itself, the achievable image quality is limited using standard detectors due to the dominating absorption effect of Compton Scattering at high energies. Especially for CT reconstruction purposes these effects have to be considered on the development path from 2D to 3D imaging. Most High Energy CT applications are therefore based on line detectors shielding scattered radiation to a maximum with an increase in imaging quality but with time consuming large volume scan capabilities. In this contribution we present the High-Energy X-ray Imaging project at the Fraunhofer Development Centre for X-ray Technology with the characterization and the potential of themore » CT-system according to metrological and other application capabilities.« less
Authors:
; ; ; ; ; ; ;  [1] ;  [2]
  1. Fraunhofer IIS/EZRT, Development Center X-Ray Technology, Flugplatzstrasse 75, 90768 Fürth (Germany)
  2. Chair of X-ray Microscopy, University of Würzburg - Physics and Astronomy (Germany)
Publication Date:
OSTI Identifier:
22263769
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1581; Journal Issue: 1; Conference: 40. annual review of progress in quantitative nondestructive evaluation, Baltimore, MD (United States), 21-26 Jul 2013, 10. international conference on Barkhausen noise and micromagnetic testing, Baltimore, MD (United States), 21-26 Jul 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 43 PARTICLE ACCELERATORS; ABSORPTION; ACCELERATORS; COMPTON EFFECT; COMPUTERIZED TOMOGRAPHY; DETECTION; MEV RANGE; NONDESTRUCTIVE TESTING; PENETRATION DEPTH; X RADIATION