skip to main content

SciTech ConnectSciTech Connect

Title: Nondestructive millimeter wave imaging and spectroscopy using dielectric focusing probes

A tool for interrogating objects over a wide band of frequencies with subwavelength resolution at small standoff distances (near field region) in the transmission mode using a single source and detector measurement setup in the millimeter wave band is presented. The design utilizes optics like principles for guiding electromagnetic millimeter waves from large cross-sectional areas to considerably smaller sub-wavelength areas. While plano-convex lenses can be used to focus waves to a fine resolution, they usually require a large stand-off distance thus resulting in alignment and spacing issues. The design procedure and simulation analysis of the focusing probes are presented in this study along with experimental verification of performance and imaging and spectroscopy examples. Nondestructive evaluation will find benefit from such an apparatus including biological tissue imaging, electronic package integrity testing, composite dielectric structure evaluation for defects and microfluidic sensing.
Authors:
; ; ;  [1]
  1. Terahertz Systems Laboratory (TeSLa) - Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48823 (United States)
Publication Date:
OSTI Identifier:
22263757
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1581; Journal Issue: 1; Conference: 40. annual review of progress in quantitative nondestructive evaluation, Baltimore, MD (United States), 21-26 Jul 2013, 10. international conference on Barkhausen noise and micromagnetic testing, Baltimore, MD (United States), 21-26 Jul 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DESIGN; DIELECTRIC MATERIALS; EVALUATION; NONDESTRUCTIVE ANALYSIS; SIMULATION; SPECTROSCOPY; WAVELENGTHS