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Title: The application of wavelet shrinkage denoising to magnetic Barkhausen noise measurements

The application of Magnetic Barkhausen Noise (MBN) as a non-destructive method of defect detection has proliferated throughout the manufacturing community. Instrument technology and measurement methodology have matured commensurately as applications have moved from the R and D labs to the fully automated manufacturing environment. These new applications present a new set of challenges including a bevy of error sources. A significant obstacle in many industrial applications is a decrease in signal to noise ratio due to (i) environmental EMI and (II) compromises in sensor design for the purposes of automation. The stochastic nature of MBN presents a challenge to any method of noise reduction. An application of wavelet shrinkage denoising is proposed as a method of decreasing extraneous noise in MBN measurements. The method is tested and yields marked improvement on measurements subject to EMI, grounding noise, and even measurements in ideal conditions.
Authors:
 [1]
  1. American Stress Technologies, Inc., 540 Alpha Drive, Pittsburgh, PA 15238 (United States)
Publication Date:
OSTI Identifier:
22263744
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1581; Journal Issue: 1; Conference: 40. annual review of progress in quantitative nondestructive evaluation, Baltimore, MD (United States), 21-26 Jul 2013, 10. international conference on Barkhausen noise and micromagnetic testing, Baltimore, MD (United States), 21-26 Jul 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DETECTION; MANUFACTURING; NOISE; SENSORS; SHRINKAGE; SIGNAL-TO-NOISE RATIO; STOCHASTIC PROCESSES