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Title: Effect of Cr doping in the microstructure, electrical and magnetic properties of In{sub 2−x}Cr{sub x}O{sub 3} system (x=0.1 and x=0.2)

In this paper a sol-gel method followed by a spin coating technique have been used to fabricate In{sub 2−x}Cr{sub x}O{sub 3} thin films with x=0.1 and 0.2. The structural analysis using an x-ray diffractometer showed that films have bixibyte cubic structure with good orientations to (222) directions. Microstructure analysis using atomic force microscope showed that sample with x=0.1 has clear pores and the particles tend to agglomerate and collect together with some holes seen on surface at x=0.2. The structure analysis using transmission electron microscope showed that the average grain size is 7.9 nm and 5.6 nm for samples x=0.1 and 0.2, respectively. The electrical measurements were carried out using Hall effect measurement system. The resistivity, carrier concentration and mobility for sample with x=0.1 is 27ohm.cm, 8.1×1016 cm{sup −3} and 1.9 cm{sup 2}V{sup −1}S{sup −1}, respectively and for higher dopant the film became insulator. The film with x=0.1 has metallic like behavior at 80-165K while semiconducting like behavior observed at 170-300K. Thermal activated conduction band and hoping conduction models have been used to estimate conducting mechanism in semiconducting part. Both samples show magnetic behavior at room temperature. The magnetic moment decreased from 6.7 emu/cm{sup 3} for x=0.1 to 2.8 emu/cm{supmore » 3} for x=0.2 while the coercivity increased from 85 Oe for x=0.1 to 120 Oe for x=0.2.« less
Authors:
; ;  [1]
  1. School of Applied Physics, Faculty of Science and Technology, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor (Malaysia)
Publication Date:
OSTI Identifier:
22262702
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1571; Journal Issue: 1; Conference: 2013 UKM FST postgraduate colloquium, Selangor (Malaysia), 3-4 Jul 2013; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; GRAIN SIZE; HALL EFFECT; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; SOL-GEL PROCESS; SPIN-ON COATING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTOMETERS