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Title: Measuring size dependent electrical properties from nanoneedle structures: Pt/ZnO Schottky diodes

This work reports the fabrication and testing of nanoneedle devices with well-defined interfaces that are amenable to a variety of structural and electrical characterization, including transmission electron microscopy. Single Pt/ZnO nanoneedle Schottky diodes were fabricated by a top down method using a combination of electro-polishing, sputtering, and focused ion beam milling. The resulting structures contained nanoscale planar heterojunctions with low ideality factors, the dimensions of which were tuned to study size-dependent electrical properties. The diameter dependence of the Pt/ZnO diode barrier height is explained by a joule heating effect and/or electronic inhomogeneity in the Pt/ZnO contact area.
Authors:
;  [1] ;  [2] ;  [1] ;  [3] ;  [1] ;  [4]
  1. Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
  2. Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
  3. (Korea, Republic of)
  4. (United States)
Publication Date:
OSTI Identifier:
22262631
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ELECTRICAL PROPERTIES; HETEROJUNCTIONS; ION BEAMS; JOULE HEATING; SCHOTTKY BARRIER DIODES; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDES