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Title: Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy

We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r{sub 33}) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from V{sub π} measurements) were used to validate the correlation between the second-harmonic signal and r{sub 33}. This also allowed us to locally map the r{sub 33} coefficient in the poled area.
Authors:
; ; ; ; ; ;  [1] ;  [2] ;  [3]
  1. College of Optical Sciences, University of Arizona, Tucson, Arizona 85721 (United States)
  2. Soluxra LLC, Seattle, Washington 98195 (United States)
  3. Department of Materials Science and Engineering, University of Washington, Seattle, Washington 98195 (United States)
Publication Date:
OSTI Identifier:
22262563
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 16; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; MICROSCOPY; MULTI-PHOTON PROCESSES; POLYMERS; SILICON; THIN FILMS