Structural analysis of Cr aggregation in ferromagnetic semiconductor (Zn,Cr)Te

Journal Article · Wed Dec 04 00:00:00 EST 2013 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4848425· OSTI ID:22261848

Kobayashi, H.; Yamawaki, K.; Nishio, Y.; Kanazawa, K.; Kuroda, S. ^[1]; Mitome, M.; Bando, Y. ^[2]

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1. Institute of Materials Science, University of Tsukuba, 1-1-1 Tennoudai, Tsukuba, 305-8573 (Japan)
2. International Center For Materials Nanoarchtectonics(MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044 (Japan)

The Cr aggregation in a ferromagnetic semiconductor (Zn,Cr)Te was studied by performing precise analyses using TEM and XRD of microscopic structure of the Cr-aggregated regions formed in iodine-doped Zn{sub 1−x}Cr{sub x}Te films with a relatively high Cr composition x ∼ 0.2. It was found that the Cr-aggregated regions are composed of Cr{sub 1−δ}Te nanocrystals of the hexagonal structure and these hexagonal precipitates are stacked preferentially on the (111)A plane of the zinc-blende (ZB) structure of the host ZnTe crystal with its c-axis nearly parallel to the (111){sub ZB} plane.

• OSTI ID: 22261848
• Journal Information: AIP Conference Proceedings, Vol. 1566, Issue 1; Conference: ICPS 2012: 31. international conference on the physics of semiconductors, Zurich (Switzerland), 29 Jul - 3 Aug 2012; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
AGGLOMERATION
CRYSTALS
DOPED MATERIALS
FILMS
IODINE
NANOSTRUCTURES
PRECIPITATION
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
ZINC SULFIDES
ZINC TELLURIDES