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Title: Microwave studies of weak localization and antilocalization in epitaxial graphene

A microwave detection method was applied to study weak localization and antilocalization in epitaxial graphene sheets grown on both polarities of SiC substrates. Both coherence and scattering length values were obtained. The scattering lengths were found to be smaller for graphene grown on C-face of SiC. The decoherence rate was found to depend linearly on temperature, showing the electron-electron scattering mechanism.
Authors:
;  [1] ;  [2] ;  [3] ;  [4]
  1. Faculty of Physics, University of Warsaw, ul. Hoża 69, 00-681 Warsaw (Poland)
  2. Faculty of Physics, University of Warsaw, ul. Hoża 69, 00-681 Warsaw, Poland and Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw (Poland)
  3. Institute of Electronic Materials Technology, ul. Wólczyñska 133, 01-919 Warsaw (Poland)
  4. Faculty of Physics, University of Warsaw, ul. Hoża 69, 00-681 Warsaw, Poland and Institute of Electronic Materials Technology, ul. Wólczyñska 133, 01-919 Warsaw (Poland)
Publication Date:
OSTI Identifier:
22261768
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1566; Journal Issue: 1; Conference: ICPS 2012: 31. international conference on the physics of semiconductors, Zurich (Switzerland), 29 Jul - 3 Aug 2012; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; DETECTION; ELECTRON-ELECTRON COLLISIONS; ELECTRON-ELECTRON INTERACTIONS; EPITAXY; GRAPHENE; SCATTERING LENGTHS; SILICON CARBIDES; SUBSTRATES