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Title: Origin and spectral degradation of the photoluminescence from a-SiO{sub x}

This paper reports for the first time on a spectral degradation of photoluminescence from a-SiO{sub x} that occurs due to the storage of the samples in ambient atmosphere. The spectra of samples with an initial emission peak E{sub PL,ini} > 2.16 eV shift to lower energies. The degraded spectra have a common maximum at E{sub PL,deg} ≈ 2.16 eV. In the spectra of samples with E{sub PL,ini} < 2.16 eV, a high-energetic shoulder around E{sub PL} ≈ 2.16 eV develops. The initial photoluminescence spectra result from radiative recombination between tail states. The degraded luminescence is dominated by two effects. On the one hand, band tail luminescence still occurs. On the other hand, the prevalent emission around E{sub PL,deg} ≈ 2.16 eV originates from recombination attributed to Si = O bonds.
Authors:
;  [1]
  1. Institute for Photovoltaics and Research Center SCoPE, University of Stuttgart Pfaffenwaldring 47, 70569 Stuttgart (Germany)
Publication Date:
OSTI Identifier:
22258769
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 19; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 38 RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY; PEAKS; PHOTOLUMINESCENCE; RECOMBINATION; SILICON OXIDES; SPECTRA