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Title: Evolution of morphology and structure of Pb thin films grown by pulsed laser deposition at different substrate temperatures

Pb thin films were prepared by pulsed laser deposition on a Si (100) substrate at different growth temperatures to investigate their morphology and structure. The morphological analysis of the thin metal films showed the formation of spherical submicrometer grains whose average size decreased with temperature. X-ray diffraction measurements confirmed that growth temperature influences the Pb polycrystalline film structure. A preferred orientation of Pb (111) normal to the substrate was achieved at 30 °C and became increasingly pronounced along the Pb (200) plane as the substrate temperature increased. These thin films could be used to synthesize innovative materials, such as metallic photocathodes, with improved photoemission performances.
Authors:
; ;  [1] ;  [2] ;  [3] ;  [4]
  1. Dipartimento di Matematica e Fisica “E. De Giorgi,” Università del Salento, 73100 Lecce (Italy)
  2. Istituto Nazionale di Fisica Nucleare e Università del Salento, 73100 Lecce (Italy)
  3. Dipartimento di Matematica e Fisica “E. De Giorgi,” Università del Salento, 73100 Lecce, Italy and National Nanotechnology Laboratory, Istituto Nanoscienze-CNR, Arnesano I-73100 (Italy)
  4. National Nanotechnology Laboratory, Istituto Nanoscienze-CNR, Arnesano I-73100 (Italy)
Publication Date:
OSTI Identifier:
22258659
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 32; Journal Issue: 2; Other Information: (c) 2014 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ENERGY BEAM DEPOSITION; GRAIN ORIENTATION; LASER RADIATION; LEAD 200; MORPHOLOGY; PHOTOCATHODES; PHOTOEMISSION; POLYCRYSTALS; PULSED IRRADIATION; SILICON; SPHERICAL CONFIGURATION; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION