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Title: Portable total reflection x-ray fluorescence analysis in the identification of unknown laboratory hazards

In this study, a portable total reflection x-ray fluorescence (TXRF) spectrometer was used to analyze unknown laboratory hazards that precipitated on exterior surfaces of cooling pipes and fume hood pipes in chemical laboratories. With the aim to examine the accuracy of TXRF analysis for the determination of elemental composition, analytical results were compared with those of wavelength-dispersive x-ray fluorescence spectrometry, scanning electron microscope and energy-dispersive x-ray spectrometry, energy-dispersive x-ray fluorescence spectrometry, inductively coupled plasma atomic emission spectrometry, x-ray diffraction spectrometry (XRD), and x-ray photoelectron spectroscopy (XPS). Detailed comparison of data confirmed that the TXRF method itself was not sufficient to determine all the elements (Zā€‰>ā€‰11) contained in the samples. In addition, results suggest that XRD should be combined with XPS in order to accurately determine compound composition. This study demonstrates that at least two analytical methods should be used in order to analyze the composition of unknown real samples.
Authors:
; ; ; ;  [1] ; ;  [2] ; ;  [3]
  1. Department of Materials Science and Engineering, Kyoto University, Yoshida-Honmachi, Sakyo-ku, Kyoto 606-8501 (Japan)
  2. Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011 (Japan)
  3. Kyoto Prefectural Technology Center for Small and Medium Enterprises, Chudojiminami machi, Shimogyo-ku, Kyoto 600-8813 (Japan)
Publication Date:
OSTI Identifier:
22258631
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 32; Journal Issue: 3; Other Information: (c) 2014 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COMPARATIVE EVALUATIONS; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; FUME HOODS; HAZARDS; PIPES; PRECIPITATION; REFLECTION; SCANNING ELECTRON MICROSCOPY; SPECTROMETERS; SURFACES; X RADIATION; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY