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Title: Low-temperature evolution of local polarization properties of PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} thin films probed by piezoresponse force microscopy

The temperature evolution of local polarization properties in epitaxial PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} films is studied by the low-temperature piezoresponse force microscopy (PFM). Pronounced changes in the film polarization state, including apparent polarization rotations and possible transitions between single-domain and polydomain states of individual ferroelectric nanocolumns, are revealed on cooling from the room temperature to 8 K using PFM imaging. More than two-fold increase in the coercive voltage extracted from the piezoresponse hysteresis loops is found on cooling from 240 to 8 K. The results are explained by the thermodynamic theory of strained epitaxial perovskite ferroelectric films.
Authors:
; ;  [1] ;  [2] ; ;  [1] ;  [3]
  1. St. Petersburg State Polytechnical University, St. Petersburg (Russian Federation)
  2. Microelectronics and Materials Physics Laboratories, University of Oulu, PL 4500, FI-90014 Oulun yliopisto (Finland)
  3. (Russian Federation)
Publication Date:
OSTI Identifier:
22257708
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMIC FORCE MICROSCOPY; EPITAXY; FERROELECTRIC MATERIALS; HYSTERESIS; PEROVSKITE; POLARIZATION; TEMPERATURE RANGE 0273-0400 K; THIN FILMS