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Title: 2D electron temperature diagnostic using soft x-ray imaging technique

We have developed a two-dimensional (2D) electron temperature (T{sub e}) diagnostic system for thermal structure studies in a low-aspect-ratio reversed field pinch (RFP). The system consists of a soft x-ray (SXR) camera with two pin holes for two-kinds of absorber foils, combined with a high-speed camera. Two SXR images with almost the same viewing area are formed through different absorber foils on a single micro-channel plate (MCP). A 2D T{sub e} image can then be obtained by calculating the intensity ratio for each element of the images. We have succeeded in distinguishing T{sub e} image in quasi-single helicity (QSH) from that in multi-helicity (MH) RFP states, where the former is characterized by concentrated magnetic fluctuation spectrum and the latter, by broad spectrum of edge magnetic fluctuations.
Authors:
; ; ; ; ; ; ;  [1] ; ;  [2]
  1. Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585 (Japan)
  2. National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5292 (Japan)
Publication Date:
OSTI Identifier:
22254994
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 3; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ASPECT RATIO; CAMERAS; ELECTRON TEMPERATURE; FLUCTUATIONS; FOILS; HELICITY; IMAGES; MICROCHANNEL ELECTRON MULTIPLIERS; REVERSED-FIELD PINCH DEVICES; REVERSE-FIELD PINCH; SOFT X RADIATION