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Title: Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

Understanding the mechanical properties of nanoscale systems requires new experimental and theoretical tools. In particular, force sensors compatible with nanomechanical testing experiments and with sensitivity in the nN range are required. Here, we report the development and testing of a tuning-fork-based force sensor for in situ nanomanipulation experiments inside a scanning electron microscope. The sensor uses a very simple design for the electronics and it allows the direct and quantitative force measurement in the 1–100 nN force range. The sensor response is initially calibrated against a nN range force standard, as, for example, a calibrated Atomic Force Microscopy cantilever; subsequently, applied force values can be directly derived using only the electric signals generated by the tuning fork. Using a homemade nanomanipulator, the quantitative force sensor has been used to analyze the mechanical deformation of multi-walled carbon nanotube bundles, where we analyzed forces in the 5–40 nN range, measured with an error bar of a few nN.
Authors:
; ;  [1] ;  [2] ;  [3]
  1. Instituto de Física “Gleb Wataghin,” Univ. Estadual de Campinas (UNICAMP), Campinas 13083-859 (Brazil)
  2. Department of Physics, University of Alberta, Edmonton, Alberta T6G 2R3 (Canada)
  3. Laboratório Nacional de Nanotecnologia, CNPEM, Campinas 13083-970 (Brazil)
Publication Date:
OSTI Identifier:
22254986
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 3; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; DEFORMATION; DESIGN; MATERIALS TESTING; MECHANICAL PROPERTIES; QUARTZ; SCANNING ELECTRON MICROSCOPY; SENSITIVITY; SENSORS; TUNING