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Title: Spatial resolution in vector potential photoelectron microscopy

The experimental spatial resolution of vector potential photoelectron microscopy is found to be much higher than expected because of the cancellation of one of the expected contributions to the point spread function. We present a new calculation of the spatial resolution with support from finite element ray tracing, and experimental results.
Authors:
 [1]
  1. R. Browning Consultants, 1 Barnhart Place, Shoreham, New York 11786 (United States)
Publication Date:
OSTI Identifier:
22254980
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 3; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CANCELLATION; FINITE ELEMENT METHOD; IMAGE PROCESSING; MICROSCOPY; SPATIAL RESOLUTION