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Title: Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser experiments

This paper presents development of an X-ray pixel detector with a multi-port charge-coupled device (MPCCD) for X-ray Free-Electron laser experiments. The fabrication process of the CCD was selected based on the X-ray radiation hardness against the estimated annual dose of 1.6 × 10{sup 14} photon/mm{sup 2}. The sensor device was optimized by maximizing the full well capacity as high as 5 Me- within 50 μm square pixels while keeping the single photon detection capability for X-ray photons higher than 6 keV and a readout speed of 60 frames/s. The system development also included a detector system for the MPCCD sensor. This paper summarizes the performance, calibration methods, and operation status.
Authors:
 [1] ; ; ; ; ; ;  [2] ; ;  [1] ;  [3] ;  [4] ; ;  [5] ;  [6] ;  [7]
  1. JASRI, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)
  2. RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)
  3. (Japan)
  4. Institute for Molecular Science, Myodaiji, Okazaki 444-8585 (Japan)
  5. XCam, Ltd, 2 Stone Circle Road, Round Spinney Industrial Estate, Northampton NN3 8RF (United Kingdom)
  6. e2v, 106 Waterhouse Lane, Chelmsford, Essex CM1 2QU (United Kingdom)
  7. Meisei Electric Co. Ltd, Naganuma 2223, Isesaki, Gunma 372-8585 (Japan)
Publication Date:
OSTI Identifier:
22254970
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 3; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CALIBRATION; CHARGE-COUPLED DEVICES; FREE ELECTRON LASERS; HARDNESS; KEV RANGE 01-10; PERFORMANCE; PHOTONS; RADIATION DETECTORS; READOUT SYSTEMS; SENSORS