skip to main content

SciTech ConnectSciTech Connect

Title: Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

The high-resolution von Hamos bent crystal spectrometer of the University of Fribourg was upgraded with a focused X-ray beam source with the aim of performing micro-sized X-ray fluorescence (XRF) measurements in the laboratory. The focused X-ray beam source integrates a collimating optics mounted on a low-power micro-spot X-ray tube and a focusing polycapillary half-lens placed in front of the sample. The performances of the setup were probed in terms of spatial and energy resolution. In particular, the fluorescence intensity and energy resolution of the von Hamos spectrometer equipped with the novel micro-focused X-ray source and a standard high-power water-cooled X-ray tube were compared. The XRF analysis capability of the new setup was assessed by measuring the dopant distribution within the core of Er-doped SiO{sub 2} optical fibers.
Authors:
 [1] ;  [2] ; ; ;  [1] ; ;  [3]
  1. Department of Physics, University of Fribourg, 1700 Fribourg (Switzerland)
  2. (Switzerland)
  3. Institute of Applied Physics, University of Bern, 3012 Bern (Switzerland)
Publication Date:
OSTI Identifier:
22254964
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE; BEAMS; CRYSTALS; DOPED MATERIALS; ENERGY RESOLUTION; FLUORESCENCE; FOCUSING; LENSES; OPTICAL FIBERS; OPTICS; SILICA; SILICON OXIDES; SPECTROMETERS; WATER COOLED REACTORS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SOURCES; X-RAY TUBES