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Title: Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: Development of a novel sample-holder

We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploit the complementary specifications of both microscopes and to preserve their optimal functionality. Experimental demonstration is reported by characterizing under ultrahigh vacuum with both techniques: Au(111) surface reconstruction and a two-layer thick graphene on 6H-SiC(0001). A set of macros to analyze LEEM/PEEM data extends the capabilities of the setup.
Authors:
; ; ; ; ; ; ;  [1]
  1. Aix-Marseille Université, CNRS, CINaM UMR 7325, 13288 Marseille (France)
Publication Date:
OSTI Identifier:
22254917
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DESIGN; ELECTRON EMISSION; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; GRAPHENE; LAYERS; MICROSCOPES; PHOTOELECTRON SPECTROSCOPY; SAMPLE HOLDERS; SILICON CARBIDES