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Title: Design and performance of AERHA, a high acceptance high resolution soft x-ray spectrometer

A soft x-ray spectrometer based on the use of an elliptical focusing mirror and a plane varied line spacing grating is described. It achieves both high resolution and high overall efficiency while remaining relatively compact. The instrument is dedicated to resonant inelastic x-ray scattering studies. We set out how this optical arrangement was judged best able to guarantee performance for the 50 − 1000 eV range within achievable fabrication targets. The AERHA (adjustable energy resolution high acceptance) spectrometer operates with an effective angular acceptance between 100 and 250 μsr (energy dependent) and a resolving power well in excess of 5000 according to the Rayleigh criterion. The high angular acceptance is obtained by means of a collecting pre-mirror. Three scattering geometries are available to enable momentum dependent measurements with 135°, 90°, and 50° scattering angles. The instrument operates on the Synchrotron SOLEIL SEXTANTS beamline which serves as a high photon flux 2 × 200 μm{sup 2} focal spot source with full polarization control.
Authors:
; ; ; ;  [1] ;  [2] ;  [2] ; ; ;  [1] ;  [2] ; ; ; ; ;  [3] ;  [3] ;  [2] ;  [2]
  1. Sorbonne Universités, UPMC Univ Paris 06, UMR 7614, Laboratoire de Chimie Physique-Matière et Rayonnement, 11 rue Pierre et Marie Curie, F-75005 Paris (France)
  2. (France)
  3. Synchrotron SOLEIL, L’Orme des Merisiers, Saint-Aubin, B.P. 48, F-91192 Gif-sur-Yvette (France)
Publication Date:
OSTI Identifier:
22254915
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ENERGY DEPENDENCE; ENERGY RESOLUTION; FABRICATION; GRATINGS; MIRRORS; PERFORMANCE; PHOTONS; POLARIZATION; SOFT X RADIATION; SPECTROMETERS; SYNCHROTRONS; X-RAY DIFFRACTION