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Title: Effect of thickness and Ti interlayers on stresses and texture transformations in thin Ag films during thermal cycling

The driving forces for the (111) to (100) texture transformation often observed during annealing of thin face-centered cubic metal films were investigated. Thin passivated silver films were produced with and without Ti adhesion layers. Stresses were measured in situ during heating to induce the texture transformation, and the texture was characterized using x-ray diffraction. Sufficiently thin films did not transform and sufficiently thick films transformed fully. Intermediate thickness films transformed to an extent dependent on thickness, leading to stable mixed textures. In the prevailing thermodynamic model, texture transformation is attributed to minimization of strain and interface energies. However, calculations using the measured stresses, known elastic constants, and estimated interface energies in this model reveal that the stresses are not sufficient to cause the texture transformation and, furthermore, that variations in interface energy cannot lead to the observed behavior. The results suggest that neither the interface energy nor the stress plays decisive roles in the texture transformation.
Authors:
 [1] ;  [2] ;  [3]
  1. Department of Materials Science and Engineering, Cornell University, 210 Bard Hall, Ithaca, New York 14853 (United States)
  2. Department of Biomedical Engineering, University of Wisconsin-Madison, 1550 Engineering Drive, Madison, Wisconsin 53706 (United States)
  3. Cornell Center for Materials Research, Cornell University, 627 Clark Hall of Science, Ithaca, New York 14853 (United States)
Publication Date:
OSTI Identifier:
22254117
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 19; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANNEALING; FCC LATTICES; LEAD; SILVER; STRESSES; TEXTURE; THERMAL CYCLING; THERMODYNAMIC MODEL; THICKNESS; THIN FILMS; X-RAY DIFFRACTION