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Title: Coherent microscopy at resolution beyond diffraction limit using post-experimental data extrapolation

Conventional microscopic records represent intensity distributions whereby local sample information is mapped onto local information at the detector. In coherent microscopy, the superposition principle of waves holds; field amplitudes are added, not intensities. This non-local representation is spread out in space and interference information combined with wave continuity allows extrapolation beyond the actual detected data. Established resolution criteria are thus circumvented and hidden object details can retrospectively be recovered from just a fraction of an interference pattern.
Authors:
;  [1]
  1. Physik Institut der Universität Zürich Winterthurerstrasse 190 CH-8057 Zürich (Switzerland)
Publication Date:
OSTI Identifier:
22254063
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 20; Other Information: (c) 2013 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; AMPLITUDES; DIFFRACTION; DISTRIBUTION; EXTRAPOLATION; INTERFERENCE; MICROSCOPY; RESOLUTION