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Title: Two-frequency heating technique at the 18 GHz electron cyclotron resonance ion source of the National Institute of Radiological Sciences

The two-frequency heating technique was studied to increase the beam intensities of highly charged ions provided by the high-voltage extraction configuration (HEC) ion source at the National Institute of Radiological Sciences (NIRS). The observed dependences on microwave power and frequency suggested that this technique improved plasma stability but it required precise frequency tuning and more microwave power than was available before 2013. Recently, a new, high-power (1200 W) wide band-width (17.1–18.5 GHz) travelling-wave-tube amplifier (TWTA) was installed. After some single tests with klystron and TWT amplifiers the simultaneous injection of the two microwaves has been successfully realized. The dependence of highly charged ions (HCI) currents on the superposed microwave power was studied by changing only the output power of one of the two amplifiers, alternatively. While operating the klystron on its fixed 18.0 GHz, the frequency of the TWTA was swept within its full limits (17.1–18.5 GHz), and the effect of this frequency on the HCI-production rate was examined under several operation conditions. As an overall result, new beam records of highly charged argon, krypton, and xenon beams were obtained at the NIRS-HEC ion source by this high-power two-frequency operation mode.
Authors:
 [1] ;  [2] ; ; ;  [1] ;  [3] ; ;  [4] ; ;  [5]
  1. National Institute of Radiological Science (NIRS), 4-9-1 Anagawa, Inage, Chiba 263-8555 (Japan)
  2. (ATOMKI), H-4026 Debrecen, Bem tér 18/c (Hungary)
  3. Institute for Nuclear Research (ATOMKI), H-4026 Debrecen, Bem tér 18/c (Hungary)
  4. Graduated School of Engineering, Osaka University, 2-1 Yamada-oka, Suita-shi, Osaka 565-0871 (Japan)
  5. Accelerator Engineering Corporation (AEC), Inage, Chiba 263-0043 (Japan)
Publication Date:
OSTI Identifier:
22253912
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; AMPLIFIERS; ARGON; ECR ION SOURCES; ELECTRIC POTENTIAL; GHZ RANGE 01-100; HYDROCHLORIC ACID; ION BEAMS; KLYSTRONS; KRYPTON; MICROWAVE RADIATION; PLASMA; TRAVELLING WAVE TUBES; XENON