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Title: The coherent interlayer resistance of a single, rotated interface between two stacks of AB graphite

The coherent, interlayer resistance of a misoriented, rotated interface between two stacks of AB graphite is determined for a variety of misorientation angles. The quantum-resistance of the ideal AB stack is on the order of 1 to 10 mΩ μm{sup 2}. For small rotation angles, the coherent interlayer resistance exponentially approaches the ideal quantum resistance at energies away from the charge neutrality point. Over a range of intermediate angles, the resistance increases exponentially with cell size for minimum size unit cells. Larger cell sizes, of similar angles, may not follow this trend. The energy dependence of the interlayer transmission is described.
Authors:
; ; ;  [1] ;  [2]
  1. Department of Electrical Engineering, University of California, Riverside, California 92521-0204 (United States)
  2. Department of Physics and Astronomy, University of California, Riverside, California 92521-0204 (United States)
Publication Date:
OSTI Identifier:
22253782
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 103; Journal Issue: 24; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ENERGY DEPENDENCE; GRAPHITE; INTERFACES; ROTATION; STACKS; TRANSMISSION