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Title: Influence of injection beam emittance on beam transmission efficiency in a cyclotron

The JAEA AVF cyclotron accelerates various kinds of high-energy ion beams for research in biotechnology and materials science. Beam intensities of an ion species of the order of 10{sup −9}–10{sup −6} ampere are often required for various experiments performed sequentially over a day. To provide ion beams with sufficient intensity and stability, an operator has to retune an ion source in a short time. However, the beam intensity downstream of the cyclotron rarely increases in proportion to the intensity at the ion source. To understand the cause of this beam behavior, transmission efficiencies of a {sup 12}C{sup 5+} beam from an electron cyclotron resonance ion source to the cyclotron were measured for various conditions of the ion source. Moreover, a feasible region for acceleration in the emittance of the injection beam was clarified using a transverse-acceptance measuring system. We confirmed that the beam emittance and profile were changed depending on the condition of the ion source and that matching between the beam emittance and the acceptance of the cyclotron was degraded. However, after fine-tuning to improve the matching, beam intensity downstream of the cyclotron increased.
Authors:
; ; ; ;  [1]
  1. Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan)
Publication Date:
OSTI Identifier:
22253742
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; BEAM INJECTION; BIOTECHNOLOGY; CARBON 12; CYCLOTRONS; ECR ION SOURCES; ION BEAMS; JAEA; MATERIALS; MEASURING METHODS